Flip-chip-integrated silicon nitride ECL at 640nm with relaxed alignment tolerances

Kluge, Ines (Corresponding author); Schulten, Michael; Tabatabaei Mashayekh, Seyed Alireza; Rodrigo, Rebecca; Ackermann, Manuel Franz; Ghannam, Ibrahim Abdel-Aziz Moh'd; Stassen, Andim; Merget, Florian; Leisching, Patrick; Witzens, Jeremy

Bellingham, Washington, USA : SPIE (2022)
Contribution to a book, Contribution to a conference proceedings

In: Silicon Photonics XVII : 22-27 January 2022, San Francisco, California, United States : 20-24 February 2022, online / Graham T. Reed, Andrew P. Knights (editors) ; sponsored and published by: SPIE
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